Electron Microprobe

Introduction

Electrochemical deposition is that coated with a thin film layer of molybdenum disulfide inorganic fullerene mechanism (IF) in the tip of Si needle, which is used as a probe of scanning tunneling electron microscopy and atomic force microscopy, because of its stable complexes, it can be used for different scan observed substances.

Atomic Force Microscopy (AFM)

Atomic force microscopy (AFM) is an important instrument having atomic resolution of surface morphology, electromagnetic properties analysis. The first AFM was successfully developed in 1985, whose pattern can be divided into contact mode and tapping mode and other modes. Due to the application scope is limited to an atomic force microscope, AFM probes belongs to consumptive material of high tech equipment, applications are not widely. The major manufacturers are in Germany, Switzerland, Bulgaria, the United States. Because of the short life of the probe, the resolution is not high nor stable and consistency is poor, countries are studying for new probes. Using molybdenum disulfide as a coating probe effectively solve the shortcomings of the current probe.

Scanning Tunneling Microscope (STM)

A scanning tunneling microscope (STM) is an instrument for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, the Nobel Prize in Physics in 1986. For an STM, good resolution is considered to be 0.1 nm lateral resolution and 0.01 nm depth resolution. With this resolution, individual atoms within materials are routinely imaged and manipulated. The STM can be used not only in ultra-high vacuum but also in air, water, and various other liquid or gas ambients, and at temperatures ranging from near zero kelvin to a few hundred degrees Celsius.

Scanning Probe Microscopy (SPM)

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Binnig and Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe. Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode.